Last edited by Tygogar
Tuesday, July 28, 2020 | History

2 edition of Field-ion microscopy found in the catalog.

Field-ion microscopy

John J. Hren

Field-ion microscopy

by John J. Hren

  • 248 Want to read
  • 36 Currently reading

Published by Plenum Press in New York .
Written in English

    Subjects:
  • Field ion microscopy.

  • Edition Notes

    Statementedited by John J. Hren and S. Ranganathan.
    ContributionsRanganathan, Srinivasa, 1941- joint author.
    Classifications
    LC ClassificationsQH212.F5 H7
    The Physical Object
    Paginationxiv, 244 p.
    Number of Pages244
    ID Numbers
    Open LibraryOL5607520M
    LC Control Number68014853

    This book covers the fundamentals of Helium Ion Microscopy (HIM) including the Gas Field Ion Source (GFIS), column and contrast formation. It also provides first hand information on nanofabrication and high resolution imaging. Relevant theoretical models and the existing simulation approaches are Format: Tapa dura. Atom-probe field ion microscopy is currently the only technique capable of imaging solid surfaces with atomic resolution, and at the same time of chemically analyzing surface atoms selected by the observer from the field ion image. Field ion microscopy has been successfully used to study most metals and many alloys, and recently good field ion.

    runrevlive.com.S Abstract This short article discusses the elements of a basic field ion microscope (FIM), the physics of the processes of field ionization and field evaporation, the factors limiting atomic resolution, the principle features of an atom probe FIM and imaging atom probe mass spectroscopy. Field-Ion Microscopy (Crystals): runrevlive.com: R. Wagner: Libros en idiomas extranjeros. Saltar al contenido principal. Prueba Prime Todos los departamentos Ir Buscar Hola, Identifícate Cuenta y listas Identifícate Cuenta y Format: Tapa blanda.

    MSA FIGs are groups of MSA members who have organized, with the approval of MSA Council, to promote a specific discipline relevant to microscopy or microanalysis. Each FIG must have a minimum of 10 members to remain active. All MSA members are eligible and . Focused Interest Groups (FIG) MSA FIGs are groups of MSA members who have organized, with the approval of MSA Council, to promote a specific discipline relevant to microscopy or microanalysis. Each FIG must have a minimum of 10 members to remain active. All MSA members are eligible and encouraged to participate in the existing FIGs.


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Field-ion microscopy by John J. Hren Download PDF EPUB FB2

Originally the motivation to develop the ToF atom probe was to use this method to obtain some more fundamental understanding of field ionization and field evaporation, the most basic physical processes in field-ion runrevlive.com: R.

Wagner. The specimen in atom probe tomography (APT) or field ion microscopy (FIM) is a field emitter, or more generally a field ion emission source. This means that these two techniques exploit the colossal static electric field that is produced at the end of a sample to emit positively charged particles.

Field ion microscopy;: Principles and applications, [Erwin W Müller] on runrevlive.com *FREE* shipping on qualifying runrevlive.com by: Despite the recent progress in developing various microanalytical tools of better spatial resolution and more sensitivity to chemical analyses for the study of various defects in metallic solids the Field-Ion Microscope (FIM) Field-ion microscopy book remains the only instrument up to now to resolve single atoms in.

This book presents the basic principles of atom-probe field ion microscopy and illustrates the various capabilities of the technique in the study of solid surfaces and interfaces at atomic resolution. A useful comparison is given with two related techniques, electron microscopy and.

Atom probe field ion microscopy of high resistivity materials Conference Sibrandij, S.J. ; Larson, D.J. ; Miller, M.K. Over the last 30 years the atom probe has proved to be a powerful tool Field-ion microscopy book studying nanometer-sized compositional fluctuations in a wide range of metallic alloys but has had only limited applications to semiconductors and ceramics.

Field Ion Microscopy. Principles and Applications. Erwin W. Müller and Tien Tzou Tsong. Elsevier, New York, x, pp., illus. $ Field Ion Microscopy: Principles and Applications. Erwin W. Müller, Tien Tzou Tsong. American Elsevier Publishing Company, - Field ion microscope - pages.

0 Reviews. From inside the book. What people are saying - Write a review. We haven't found any reviews in the usual places. The Theoretical and Technical Development of Field-Ion Microscopy. Services for this Book. Download Product Flyer Download High-Resolution Cover.

Facebook Twitter LinkedIn Google++. Recommended for you. Bibliographic Information Bibliographic Information. Book Title Field-Ion. Sep 04,  · Field Ion Microscopy. Principles and Applications.

Erwin W. Müller and Tien Tzou Tsong. Elsevier, New York, x, pp., illus. $19Author: D. Brandon. Atom Probe Field Ion Microscopy by M.

Miller, A. Cerezo, M. Hetherington, G. Smith, Alfred Cerezo | Read Reviews. Hardcover. This book gives a definitive and up-to-date account of the field, and is written by leading authorities on the subject. It includes recent advances in the method which have allowed for new and Price: $ Despite the recent progress in developing various microanalytical tools of better spatial resolution and more sensitivity to chemical analyses for the study of various defects in metallic solids the Field-Ion Microscope (FIM) still remains the only instrument up to now to resolve single atoms in the surface of a.

Note: Citations are based on reference standards. However, formatting rules can vary widely between applications and fields of interest or study. The specific requirements or preferences of your reviewing publisher, classroom teacher, institution or organization should be applied.

The field ionization microscope (FIM) is, at present, the only available experimental device that routinely permits direct observation of atomic detail on surfaces. Accordingly, the FIM affords an Author: Leonard Nanis. This book covers the fundamentals of Helium Ion Microscopy (HIM) including the Gas Field Ion Source (GFIS), column and contrast formation.

It also provides first hand information on nanofabrication and high resolution imaging. Relevant theoretical models and the existing simulation approaches are. Book Description. Atom-probe field ion microscopy is the only technique capable of imaging solid surfaces with atomic resolution, while chemically analysing surface atoms selected by the observer from the field ion runrevlive.com Range: $ - $ Field-emission microscopy (FEM) is an analytical technique used in materials science to investigate molecular surface structures and their electronic properties.

Invented by Erwin Wilhelm Müller inthe FEM was one of the first surface-analysis instruments that approached near-atomic resolution. Radiation effects in metallic materials were investigated using the field ion microscopy technique.

Modes of radiation exposure for development of amorphized states in subsurface regions of platinum are determined.

It is found that the phenomenon of metal amorphization in the subsurface regions occurs up to a sample depth of 12 nm under an increase in the fluence to ions/cm2 and the above Author: Vladimir Alexandrovich Ivchenko. Field Ion Microscopy for the Characterization of Scanning Probes 5 William Paul and Peter Gr€utter Field ion microscopy (FIM) • Scanning probe microscopy (SPM) • Scanning 5 Field Ion Microscopy for the Characterization of Scanning Probes (TEM, SEM, STM, and AFM have all demonstrated atomic spatial resolution), there.

Atom-probe field ion microscopy is currently the only technique capable of imaging solid surfaces with atomic resolution, and at the same time of chemically analyzing surface atoms selected by the observer from the field ion image. Field ion microscopy has been successfully used to study most metals and many alloys, and recently good field ion images of some semiconductors and even ceramic.

Atom Probe Field Ion Microscopy M. K. Miller, A. Cerezo, the late M. G. Hetherington, and G. D. W. Smith. A Clarendon Press Publication. Monographs on the Physics and Chemistry of Materials.Request PDF | Advanced data mining in field ion microscopy | Field ion microscopy (FIM) allows to image individual surface atoms by exploiting the effect of an intense electric field.

Widespread.Field ion microscopy (FIM) can be used to study the three-dimensional structure of materials, such as metals and semiconductors, because successive atom layers can be ionized and removed from the surface by field evaporation.